CT-ALPHA
The CT-ALPHA system meets the most stringent demands in CT X‑ray. With this Computed Tomography system, ProCon X‑ray GmbH offers the highest possible flexibility for individual customer requirements.
Industrial X‑ray Computed Tomography (CT)- 3D volume CT
- Non-destructive testing (NDT) – 2D and 3D
- Quality control independent of material
- Defect recognition (voids, cracks, …)
- Contactless metrology
- Numerous CT artefact corrections
- Helix CT
- Easy operation
- Radiation safety better than 1 µSv/h
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Highly Customisable
This most flexible system can be equipped with a wide variety of X-ray sources.
The following are possible, among others:
160 kV Nanotube with 0.15 µm max. spatial resolution and max. 16 W
240 kV µ-Focus with 0.5 µm max. spatial resolution and max. 50 W
320 kV µ-Focus with 3 µm max. spatial resolution and max. 500 W
450 kV Mesofocus with 60 µm Spot size and max. 450 W
600 kV minifocus with 0.7 mm spot size and max. 1500 W
A combination of different tubes is also possible.
The free configurable axis system gives the user the flexibility to perform a wide variety of scan trajectories according to your application. From the standard axial-CT, via fast Stacked-Scans, Tilted-Rotation-Axis or Laminography-CT, to the Multi-Helix-Scan with double Measurement-Field-Extension.
The CT-ALPHA system is ideal for non-destructive testing, materials investigations and, in particular, dimensional measurements of internal structures, undercuts and free-form surfaces.
Specifications
X-ray tubes | up to 300 kV microfocus |
Min. focal spot | 0.5 µm |
Detector | up to 27 MP |
Detector sizes | up to 430 x 430 mm |
Max. scan speed | < 10 seconds per part |
Axes | up to 8 |
Accuracy (VDI 2630) | 6 µm + (L / 75) |
System weight | < 2.000 kg possible* |
Phase Contrast
Our newly developed phase contrast add-on brings cutting-edge X-ray imaging to your CT system with unmatched simplicity and flexibility.
Using a specially designed pinhole array, it generates multiple fine, parallel X-ray beams that pass through the specimen. In a single scan, it captures absorption, phase contrast, and dark-field scattering – revealing structural details invisible to conventional absorption-based X-ray imaging.
Fundamental Idea
Your benefits at a glance
Easy integration: Simply mount the add-on in front of the detector — no major system modifications required.
New contrast modes: Visualise structures and features that remain hidden with traditional X-ray contrast.
Flexible application: Suitable for a wide range of materials, from lightweight composites like CFRP to biological samples.
Fast data acquisition: Multi-beam technology dramatically reduces scan times.
Comprehensive analysis: Absorption, phase shift, and scattering — all in one scan.
No rotation required: Scattering is recorded in all directions simultaneously.
Whether for research, quality control, or development, this add-on expands your CT’s capabilities, enabling you to see more, understand more, and discover the invisible — all with a simple retrofit.
Contrast Mechanisms
Hardware and Software Made for each other
The best hardware needs a great software program to run it and to help you get the best results out of your investment.
We create our own software, as well as recommend software from third parties based on your specific use case.
Learn more about software for your CT system here
Software
Get in Touch with us
Want to find out more about a CT system for your organisation or institution?
Contact us.